Testing Optical: Off-line Systems
D & D S is agent for Dr
Schwab Inspection Technology Gmbh.
Dr Schwab optical testing systems, off line and in line offer unparralleled
variety of measurement features for Glass masters, stampers and blank
or finished substrates.
Based upon thorough customer analysis requirements, the products are
engineered with integration of the latest opto-electronics components,
and respond closely to the demand of optical media manufacturing,
specially in the cd and dvd formats, writables, rewritables and replicated.
Off-line Systems Windows NT-based
software for easy handling and operation, fully network
compatible, fully automated measurement. |
Mastering: CD, DVD and future high-density
formats
STRATOS:
Photoresist Thickness Measurement System |
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For glass masters
- Measures thickness and uniformity of photo resist
layers on unrecorded glass masters
- Covers the range from 500nm down to ultra-thin
coatings of 20nm, essential for future disc formats
- Supplies AFM accuracy results
- Resolution 0.2nm, repeatability <0.5nm
- Unique stratos measurement principle, developed
with input from
- Philips Optical Disc Technology Centre
- 3,000 spots are measured within 100 seconds
- Sample thickness 1.6mm – 8mm
- Fully automated measurement combined with Windows
NT®-based software for easy handling and operation;
network compatible
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Mastering: an all-in-one system
to cover the entire mastering quality control process
at every stage of production
DOMSXE-blu:
Diffraction Order Measurement System |
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For glass masters, stampers, replicas
- Determines groove and pit profiles, including wall
angle, top/bottom width and groove profile asymmetry
(clouding)
- Every track pitch from 460nm to 2,000nm (1st diffraction
order down to 230nm)
- Combines blue laser and spectrometer, covering
current and future disc formats
- Includes glass master photo resist thickness measurement
by spectrometer for coating thickness 80nm - 600nm
- Optional high resolution CCD camera module for
local defect detection and classification
- Fully automated measurement process, including
automatic laser and detector positioning
- Windows NT®-based software for easy handling
and operation; network compatible
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Replication: a single system to evaluate
all essential optical and physical parameters
ARGUS:
Universal Disc Measurement System |
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For substrates, half-discs, finished
discs
- Measures all current disc formats: no other system
offers such comprehensive test capabilities
- Relative, absolute and orientation birefringence,
plus optional perpendicular birefringence
- Radial and tangential tilt
- Pit/groove dimensions and clouding, including DVD
- Thickness of sputter layers Al, Ag, Au, Cr, Si
- Thickness of all dyes, including DVD-R
- Substrate/bonding/lacquer/hard-coating thickness
- Eccentricity
- 10,000 spots (all quantities) are measured within
15 seconds
- Fully automated measurement combined with Windows
NT®-based software for easy handling and operation;
network compatible
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You Interested? Contact DDS! |
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